Metal-to-metal junctions can exhibit non-linear characteristics as a result of corrosion or low contact pressure. The non-linearity can be seen on a V-I curve tracer and has been implicated in causing intermodulation interference, especially in the 5-30 MHz band. The junction behavior at RF under actual operating conditions cannot be accurately predicted from the low frequency V-I curve, however.
Measurements have been made of the actual level of 3rd order Intermodulation Products generated at RF by a variety of connections. The results are reported here, with a description of the factors found to influence the junction's behavior.